Modeling, analysis and design of reliable digital imaging system

Abstract

Scope and Method of Study: Charge Coupled Device (CCD) is one of the most popular imaging sensors such as digital camera, digital camcorders, and digital x-ray diagnosis systems to mention a few. As the need for high resolution and high sensitive CCDs, high yield and solid reliability are becoming critical requirements for CCDs. In this context, soft-test/repair method must be developed to achieve high yield and reliability for CCDs.

Findings and Conclusions: The purpose of this study was to propose soft-test and repair methods for defective pixels in CCD system, thereby realizing more reliable and cost-effective CCD Systems. Various test/repair algorithms are proposed and verified, and BIST/BISR architecture was proposed and the design was verified through verilog HDL simulation. Extensive parametric simulation results are also shown.