| dc.contributor.author | James, Donald W., | en_US |
| dc.date.accessioned | 2013-08-16T12:27:56Z | |
| dc.date.available | 2013-08-16T12:27:56Z | |
| dc.date.issued | 1979 | en_US |
| dc.identifier.uri | https://hdl.handle.net/11244/4677 | |
| dc.format.extent | xv, 138 leaves : | en_US |
| dc.subject | Engineering, Electronics and Electrical. | en_US |
| dc.title | Enhanced high speed serial data test system. | en_US |
| dc.type | Thesis | en_US |
| dc.thesis.degree | D.Engr. | en_US |
| dc.thesis.degreeDiscipline | School of Electrical and Computer Engineering | en_US |
| dc.note | Source: Dissertation Abstracts International, Volume: 40-12, Section: B, page: 5760. | en_US |
| ou.identifier | (UMI)AAI8012282 | en_US |
| ou.group | College of Engineering::School of Electrical and Computer Engineering | |
