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dc.contributor.advisorDeBrunner, Victor,en_US
dc.contributor.authorLakshmanan, Valliappa.en_US
dc.date.accessioned2013-08-16T12:18:23Z
dc.date.available2013-08-16T12:18:23Z
dc.date.issued2001en_US
dc.identifier.urihttps://hdl.handle.net/11244/373
dc.description.abstractWe also develop a way of objectively evaluating texture segmentation algorithms on natural and synthetic texture patches. Finally, our multiscale segmentation approach is demonstrated on several families of real-world images. It is shown that quality of the segmented results at the different scales is significantly improved.en_US
dc.description.abstractA novel method of performing multiscale segmentation of images using texture properties is introduced. Various methods of segmentation at a single scale, including texture segmentation, are described and compared with the K-Means clustering of texture vectors used in this thesis.en_US
dc.description.abstractWe survey the state of the art in multiscale segmentation and identify some drawbacks in the traditional approach to multiscale segmentation---image pyramids and quad-tree decomposition, especially in typical applications that make use of the segmented results. We then introduce the idea of multiscale segmentation within the context of the segmented regions themselves instead of, as is traditional, working in the context of the original image. It is shown that this new multiscale approach can be incorporated into the K-Means clustering technique as a steady relaxation of inter-cluster distances.en_US
dc.format.extentvii, 108 leaves :en_US
dc.subjectEngineering, Electronics and Electrical.en_US
dc.subjectAlgorithms.en_US
dc.subjectGeophysics.en_US
dc.subjectImage processing.en_US
dc.subjectImages, Photographic.en_US
dc.titleA hierarchical, multiscale texture segmentation algorithm for real-world scenes.en_US
dc.typeThesisen_US
dc.thesis.degreePh.D.en_US
dc.thesis.degreeDisciplineSchool of Electrical and Computer Engineeringen_US
dc.noteMajor Professor: Victor DeBrunner.en_US
dc.noteSource: Dissertation Abstracts International, Volume: 62-10, Section: B, page: 4692.en_US
ou.identifier(UMI)AAI3028801en_US
ou.groupCollege of Engineering::School of Electrical and Computer Engineering


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