Electrical and optical characterization of defect levels in Bi12GeO20 and Bi12SiO20
dc.contributor.advisor | McKeever, Steve | |
dc.contributor.author | Bloom, Danning Wilford | |
dc.date.accessioned | 2016-04-07T17:57:44Z | |
dc.date.available | 2016-04-07T17:57:44Z | |
dc.date.issued | 1997-05 | |
dc.identifier.uri | https://hdl.handle.net/11244/33215 | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.rights | Copyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material. | |
dc.title | Electrical and optical characterization of defect levels in Bi12GeO20 and Bi12SiO20 | |
dc.contributor.committeeMember | Martin, Joel J. | |
osu.filename | Thesis-1997D-B655e.pdf | |
osu.accesstype | Open Access | |
dc.type.genre | Dissertation | |
dc.type.material | Text | |
thesis.degree.discipline | Physics | |
thesis.degree.grantor | Oklahoma State University |
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OSU Dissertations [11222]