Analysis of Emission Source Microscopy Through Simulation
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In 2016, a method of resolving an electric field radiation source by sampling in the far field was published. The result of this publication was a device, deemed the Emission Source Microscope (ESM). Following these developments, this paper presents a comparison and validation study between results created with an ESM, and a simulated environment which is designed to mimic the operation of a physical ESM. From the developmental process of this study, this paper addresses the issues that arise in Emission Source Microscopy and present best practices associated with application. This paper concludes with a study of this assertion by creating a simulation environment that compares ESM performance using two antennas of differing gain and beamwidth characteristics.
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