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dc.contributor.advisorBunting, Charles F.
dc.contributor.authorDixon, Jacob
dc.date.accessioned2019-03-29T15:39:59Z
dc.date.available2019-03-29T15:39:59Z
dc.date.issued2018-05-01
dc.identifier.urihttps://hdl.handle.net/11244/317821
dc.description.abstractIn 2016, a method of resolving an electric field radiation source by sampling in the far field was published. The result of this publication was a device, deemed the Emission Source Microscope (ESM). Following these developments, this paper presents a comparison and validation study between results created with an ESM, and a simulated environment which is designed to mimic the operation of a physical ESM. From the developmental process of this study, this paper addresses the issues that arise in Emission Source Microscopy and present best practices associated with application. This paper concludes with a study of this assertion by creating a simulation environment that compares ESM performance using two antennas of differing gain and beamwidth characteristics.
dc.formatapplication/pdf
dc.languageen_US
dc.rightsCopyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material.
dc.titleAnalysis of Emission Source Microscopy Through Simulation
dc.contributor.committeeMemberWest, James C.
dc.contributor.committeeMemberEkin, Sabit
osu.filenameDixon_okstate_0664M_15706.pdf
osu.accesstypeOpen Access
dc.description.departmentElectrical Engineering
dc.type.genreThesis
dc.type.materialtext


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