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dc.contributor.authorJorge L. Mendoza
dc.contributor.authorDavid E. Bard
dc.contributor.authorMichael D. Mumford
dc.contributor.authorSiew C. Ang
dc.date.accessioned2016-01-14T19:53:37Z
dc.date.accessioned2016-03-30T15:32:13Z
dc.date.available2016-01-14T19:53:37Z
dc.date.available2016-03-30T15:32:13Z
dc.date.issued2004-10-01
dc.identifier.citationMendoza, J. L., Bard, D. E., Mumford, M. D., & Ang, S. C. (2004). Criterion-Related Validity in Multiple-Hurdle Designs: Estimation and Bias. Organizational Research Methods, 7(4), 418-441. doi: 10.1177/1094428104268752en_US
dc.identifier.urihttps://hdl.handle.net/11244/25361
dc.description.abstractEmployee selection often involves a series of sequential tests (or hurdles). However, validation strategies under this complex design are not found in the literature. Missing is a discussion of the statistical properties important in establishing criterion-related validity in multiple-hurdle designs. The authors address this gap in the literature by suggesting a general statistical model for range restriction corrections. Because the multiple-hurdle design includes as special cases predictive and concurrent designs, the corrections apply also to these designs. The general correction model is based on algorithms from the missing data literature. Two missing data procedures are examined: the estimation-maximization procedure and the Bayesian multiple imputation (MI) procedure. These procedures are large-sample equivalent and often yield similar results. The MI procedure, however, has the added advantage of providing easily obtainable standard errors. A hypothetical example of a multiple-hurdle design is used to illustrate the procedures.en_US
dc.language.isoen_USen_US
dc.publisherOrganizational Research Methods
dc.subjectselectionen_US
dc.subjectrange restrictionen_US
dc.subjectmultiple-hurdle designen_US
dc.subjectmissing dataen_US
dc.subjectcorrectionsen_US
dc.titleCriterion-Related Validity in Multiple-Hurdle Designs: Estimation and Biasen_US
dc.typeResearch Articleen_US
dc.description.peerreviewYesen_US
dc.description.peerreviewnoteshttps://us.sagepub.com/en-us/nam/manuscript-submission-guidelinesen_US
dc.identifier.doi10.1177/1094428104268752en_US
dc.rights.requestablefalseen_US


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