dc.date.accessioned | 2015-07-23T15:35:11Z | |
dc.date.available | 2015-07-23T15:35:11Z | |
dc.date.issued | 1970-04-07 | |
dc.identifier | pat3504983 | |
dc.identifier.uri | https://hdl.handle.net/11244/15305 | |
dc.description.abstract | An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of monochromatic light, an ellipsoidal mirror reflector with an aperture therein, a specimen support position at the first focal point of said reflector, means for directing the monochromatic light through the aperture onto the support, and an averaging sphere detector positioned adjacent a second focal point of the reflector, the first and second focal points being on a common axis normal to the first focal plane of the reflector. | |
dc.format | application/pdf | |
dc.format.extent | 6 pages | |
dc.language | en_US | |
dc.publisher | U.S. Patent and Trademark Office | |
dc.relation | Oklahoma State University. Library. Digital Resources and Discovery Services | |
dc.title | Ellipoidal Mirror Reflectometer Including Means for Averaging the Radiation Reflected from the Sample | |
dc.type | text | |
osu.filename | pat3504983.pdf | |
osu.accesstype | Open Access | |
dc.type.genre | Patent | |
dc.contributor.inventor | Richmond, Joseph C. | |
dc.contributor.inventor | Chase, Chevy | |
dc.contributor.inventor | and Dunn, Stuart Thomas | |
dc.identifier.patentID | 3,504,983 | |
dc.date.filed | 1966-05-31 | |
dc.contributor.assignee | United States of America as represented by the Administrator of the National Aeronautics and Space Administration | |
dc.subject.primaryusclass | 356/448 | |
dc.subject.otherusclasses | 356/445 | |
dc.subject.cpcclasses | G01N 21/474 (20130101) | |