Ellipoidal Mirror Reflectometer Including Means for Averaging the Radiation Reflected from the Sample
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Date
1970-04-07Author
Richmond, Joseph C.
Chase, Chevy
and Dunn, Stuart Thomas
United States of America as represented by the Administrator of the National Aeronautics and Space Administration
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An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of monochromatic light, an ellipsoidal mirror reflector with an aperture therein, a specimen support position at the first focal point of said reflector, means for directing the monochromatic light through the aperture onto the support, and an averaging sphere detector positioned adjacent a second focal point of the reflector, the first and second focal points being on a common axis normal to the first focal plane of the reflector.
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