Richmond, Joseph C.; Chase, Chevy; and Dunn, Stuart Thomas; United States of America as represented by the Administrator of the National Aeronautics and Space Administration (U.S. Patent and Trademark Office, 1970-04-07)
An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of monochromatic light, an ellipsoidal mirror reflector with an aperture therein, a specimen support position at the first ...