Browsing by Subject "G01N 21/474 (20130101)"
Now showing items 1-1 of 1
-
Ellipoidal Mirror Reflectometer Including Means for Averaging the Radiation Reflected from the Sample
(U.S. Patent and Trademark Office, 1970-04-07)An ellipsoidal mirror reflectometer for measuring the reflectance of materials includes a source of monochromatic light, an ellipsoidal mirror reflector with an aperture therein, a specimen support position at the first ...