Microwave Electrometry with Rydberg Eletromagnetically Induced Transparency in Vapor Cells

dc.contributor.advisorShaffer, James P
dc.contributor.authorFan, Haoquan
dc.contributor.committeeMemberBarker, Peter
dc.contributor.committeeMemberMoore-Furneaux, John E
dc.contributor.committeeMemberAbraham, Eric R I
dc.contributor.committeeMemberParker, Gregory A
dc.date.accessioned2016-07-25T13:17:50Z
dc.date.available2016-07-25T13:17:50Z
dc.date.issued2016-07-20
dc.date.manuscript2016-06-01
dc.description.abstractAn atom-based approach is presented to detect absolute microwave (MW) electric fields (E-fields). The approach uses Rydberg atoms in vapor cells at room temperature. The MW E-field measurements utilize a bright resonance prepared within an electromagnetically induced transparency (EIT) window. The large transition dipole moments between energetically adjacent Rydberg states enable this method to make traceable E-field measurements with a sensitivity that is several orders of magnitude higher than the current standard for MW E-field measurements. The method can be used to image MW E-field in the near field regime with a subwavelength resolution of $\mathrm{\lambda_{MW}/650}$, where $\mathrm{\lambda_{MW}}$ is the wavelength of the MW E-field. A high accuracy of $\mathrm{1\%}$ has been reached by minimizing the effects of the vapor cell geometry on the measured MW E-field. The dissertation also presents an alternative technique to perform the MW E-field measurement using dispersive properties of the EIT spectrum with a prism vapor cell. Recently, we applied a homodyne detection technique with a Mach Zehnder interferometer to achieve a new sensitivity limit for the MW E-field measurement, $\mathrm{\sim3~\mu Vcm^{-1}Hz^{-1/2}}$. The new sensitivity is one order of magnitude better than our prior best sensitivity presented in Ref. [Nat. Phys. 8, 819 (2012)]. The Rydberg atom-based method is promising to be a new standard for MW E-field measurements and to develop into portable devices in the field of MW technologies.en_US
dc.identifier.urihttp://hdl.handle.net/11244/44586
dc.languageen_USen_US
dc.subjectPhysics, Atomic.en_US
dc.subjectPhysics, Optics.en_US
dc.subjectEngineering, Electronics and Electrical.en_US
dc.thesis.degreePh.D.en_US
dc.titleMicrowave Electrometry with Rydberg Eletromagnetically Induced Transparency in Vapor Cellsen_US
ou.groupCollege of Arts and Sciences::Homer L. Dodge Department of Physics and Astronomyen_US

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