High-Resolution Transmission Electron Microscopy Analysis of Nanostructures

Abstract

Nanostructures are of great interest because of the unique size range they occupy between the bulk and the quantum regimes. Characterizing nanostructures requires tools that can access this size regime. Transmission electron microscopy (TEM) is one of the most important tools used to study materials and structures on the nanoscale because of its high-resolution imaging capabilities and the number of different characterization techniques that one single instrument can perform. In this dissertation, the characterization of several types of nanostructures using TEM and TEM-based techniques is described in detail. These techniques are used in conjunction with other nanoscale characterization methods such as AFM, XRD, and SEM to obtain a more complete understanding of the structures being studied.