An investigation of charge transport mechanisms in evaporated oxide films on etched silicon surfaces /

Simple item page
dc.contributor.authorTodd, David Arlen,en_US
dc.date.accessioned2013-08-16T12:23:28Z
dc.date.available2013-08-16T12:23:28Z
dc.date.issued1968en_US
dc.format.extentv, 43 leaves :en_US
dc.identifier.urihttp://hdl.handle.net/11244/2467
dc.noteSource: Dissertation Abstracts International, Volume: 29-08, Section: B, page: 2890.en_US
dc.subjectEngineering, Electronics and Electrical.en_US
dc.subjectSilicon.en_US
dc.subjectSemiconductors.en_US
dc.thesis.degreePh.D.en_US
dc.thesis.degreeDisciplineSchool of Electrical and Computer Engineeringen_US
dc.titleAn investigation of charge transport mechanisms in evaporated oxide films on etched silicon surfaces /en_US
dc.typeThesisen_US
ou.groupCollege of Engineering::School of Electrical and Computer Engineering
ou.identifier(UMI)AAI6901996en_US

Files

Original bundle

Now showing 1 - 1 of 1
Thumbnail Image
Name:
6901996.PDF
Size:
957.3 KB
Format:
Adobe Portable Document Format
Download

Collections

OU - Dissertations