TRACER: A Reliability-First GemNet Baseline for Trustworthy Computational Materials Discovery

dc.contributor.authorDatta, Gourab
dc.contributor.authorSharif, Sarah
dc.contributor.authorBanad, Yaser
dc.date.accessioned2026-06-26T15:16:51Z
dc.date.available2026-06-26T15:16:51Z
dc.date.issued2026
dc.descriptionThis work introduces TRACER, a reliability-first machine learning pipeline for computational materials discovery. Built on a GemNet-based graph neural network, TRACER achieves a state-of-the-art Mean Absolute Error of 0.0370 eV/atom on the JARVIS-DFT dataset, significantly outperforming standard baselines like ALIGNN. Beyond high accuracy, our framework addresses a critical bottleneck in high-throughput screening by integrating deep ensemble-based uncertainty quantification. This allows the model to act as an automated triage system that confidently screens standard candidate materials while reliably flagging structurally complex outliers such as oxygen-rich clusters and transition-metal dimers for higher-fidelity quantum mechanical validation. Ultimately, TRACER provides a transparent, reproducible, and highly adaptable blueprint for deploying trustworthy AI in materials science.
dc.description.abstractComputational materials discovery is increasingly driven by graph neural networks (GNNs); however, deployment is constrained by uncertain robustness and inadequately validated uncertainty quantification (UQ). The ALIGNN, MACE, and Open Catalyst models have made strides, but there is still no standardized framework for reproducibility, fairness, and dependability. We introduce Transparent and Reliable Accuracy, Confidence, and Error Ranking (TRACER), a comprehensive, transparent, and repeatable reliability-first pipeline built on a GemNet-based Graph Neural Network (GNN). Using a held-out test set investigate robustness via sensitivity to graph cutoff, architectural depth, and training-data fraction. Achieving competitive accuracy, single GemNet model records a Mean Absolute Error (MAE) of 0.0370 eVatom−1 on JARVIS-DFT, representing a 25.8% reduction in MAE compared to an identical split ALIGNN baseline. UQ benchmarking demonstrates that deep ensembles provide informative uncertainty estimates that strongly correlate with error, proving superior for “hard-case” identification and triage. We also present valuable negative results: FiLM-based domain adaptation provides no significant benefit on this single domain task, and a material-aware “Gate-Hard” heuristic is outperformed by simple variance-only ranking for identifying high-error cases. The framework offers substantial operational utility, demonstrating F1 score of 0.378 (N=3 ensemble, 20% budget) compared to 0.325 for random selection in capturing high error cases compared to random selection when working with tight computational budgets. Confirmed by generalization to Matbench Perovskites, TRACER provides reproducible and confidence-aware computational materials discovery, as well as a strong predictor.
dc.description.notesThis material is based upon work supported by the Air Force Office of Scientific Research (AFOSR) under award number FA9550-25-1-0322. To support transparency and reproducibility in computational materials science, the full TRACER workflow and codebase have been made publicly available via GitHub, and the study utilizes the open-access JARVIS-DFT 3D dataset.
dc.description.peerreviewYes
dc.identifier.bibliographicCitationDatta, G., Sharif, S. & Banad, Y. TRACER: a reliability-first GemNet baseline for trustworthy computational materials discovery. Sci Rep 16, 14962 (2026). https://doi.org/10.1038/s41598-026-45279-6
dc.identifier.doi10.1038/s41598-026-45279-6
dc.identifier.urihttps://shareok.org//handle/11244/342714
dc.languageen_US
dc.relation.isPartOfScientific Reports
dc.relation.isPartOfSeries16(14962) (2026)
dc.rightsAttribution 4.0 International
dc.subjectComputational Material Discovery
dc.subjectGraph Neural Networks
dc.subjectUncertainty Quantification
dc.subjectReliability and Robustness
dc.subjectDeep Ensembles
dc.subjectGemNet Architecture
dc.subjectJARVIS-DFT Dataset
dc.subjectMachine Learning for Materials
dc.titleTRACER: A Reliability-First GemNet Baseline for Trustworthy Computational Materials Discovery
dc.typeArticle
ou.groupGallogly College of Engineering::School of Electrical and Computer Engineering

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