dc.contributor.advisor | Johnson, Louis G. | |
dc.contributor.author | Mostafavi, Mohammad Taghi | |
dc.date.accessioned | 2023-10-03T15:57:28Z | |
dc.date.available | 2023-10-03T15:57:28Z | |
dc.date.issued | 1986-05 | |
dc.identifier.uri | https://hdl.handle.net/11244/339752 | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.rights | Copyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material. | |
dc.title | Test generation at the transistor level for MOS combinational logic circuits | |
dc.contributor.committeeMember | Soldan, David L. | |
dc.contributor.committeeMember | Folk, Michael J. | |
dc.contributor.committeeMember | Basore, Bennett L. | |
dc.contributor.committeeMember | Harris, Betty L. | |
osu.filename | Thesis-1986D-M915t.pdf | |
osu.accesstype | Open Access | |
dc.type.genre | Dissertation | |
dc.type.material | Text | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | Oklahoma State University | |