| dc.contributor.author | Small, J. A. | |
| dc.contributor.author | Cheville, R. A. | |
| dc.date.accessioned | 2018-09-21T17:51:35Z | |
| dc.date.available | 2018-09-21T17:51:35Z | |
| dc.date.issued | 2004-05-24 | |
| dc.identifier | oksd_small_measurementandn_2004 | |
| dc.identifier.citation | Small, J. A., & Cheville, R. A. (2004). Measurement and noise characterization of optically induced index changes using THz interferometry. Applied Physics Letters, 84(21), 4328-4330. https://doi.org/10.1063/1.1758292 | |
| dc.identifier.uri | https://hdl.handle.net/11244/301767 | |
| dc.description.abstract | A Michelson interferometer designed for broadband single-cycle THz pulses is used to characterize optically induced index changes in semiconductors which result in submicron changes in optical path length. The interferometric measurements are compared both to standard THz time-domain spectroscopy (THz-TDS) and differential THz-TDS based on modulation of the sample. By analyzing noise contributions in THz spectroscopy systems, it is shown that the destructive interference achieved in THz interferometry reduces both some sources of random errors as well as errors due to system drift. | |
| dc.format | application/pdf | |
| dc.language | en_US | |
| dc.publisher | AIP Publishing | |
| dc.rights | This material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information. | |
| dc.title | Measurement and noise characterization of optically induced index changes using THz interferometry | |
| osu.filename | oksd_small_measurementandn_2004.pdf | |
| dc.description.peerreview | Peer reviewed | |
| dc.identifier.doi | 10.1063/1.1758292 | |
| dc.description.department | Electrical and Computer Engineering | |
| dc.type.genre | Article | |
| dc.type.material | Text | |
