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Photoelectronic analysis of imperfections in grown stannic oxide single crystals

dc.contributor.advisorKohnke, E. E.
dc.contributor.authorHouston, Jack Edward
dc.date.accessioned2016-02-09T16:17:00Z
dc.date.available2016-02-09T16:17:00Z
dc.date.issued1965-05
dc.identifier.urihttps://hdl.handle.net/11244/27729
dc.formatapplication/pdf
dc.languageen_US
dc.rightsCopyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material.
dc.titlePhotoelectronic analysis of imperfections in grown stannic oxide single crystals
dc.contributor.committeeMemberLewis, William J.
dc.contributor.committeeMemberDevlin, J. Paul
dc.contributor.committeeMemberHarrington, H. E.
dc.contributor.committeeMemberThurston, G. B.
osu.filenameThesis-1965D-H843p.pdf
osu.accesstypeOpen Access
dc.type.genreDissertation
dc.type.materialText
thesis.degree.disciplinePhysics
thesis.degree.grantorOklahoma State University


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