dc.contributor.author | Todd, David Arlen, | en_US |
dc.date.accessioned | 2013-08-16T12:23:28Z | |
dc.date.available | 2013-08-16T12:23:28Z | |
dc.date.issued | 1968 | en_US |
dc.identifier.uri | https://hdl.handle.net/11244/2467 | |
dc.format.extent | v, 43 leaves : | en_US |
dc.subject | Engineering, Electronics and Electrical. | en_US |
dc.subject | Silicon. | en_US |
dc.subject | Semiconductors. | en_US |
dc.title | An investigation of charge transport mechanisms in evaporated oxide films on etched silicon surfaces / | en_US |
dc.type | Thesis | en_US |
dc.thesis.degree | Ph.D. | en_US |
dc.thesis.degreeDiscipline | School of Electrical and Computer Engineering | en_US |
dc.note | Source: Dissertation Abstracts International, Volume: 29-08, Section: B, page: 2890. | en_US |
ou.identifier | (UMI)AAI6901996 | en_US |
ou.group | College of Engineering::School of Electrical and Computer Engineering | |