dc.contributor.author | Qu, Dongxia | |
dc.contributor.author | Grischkowsky, Daniel R. | |
dc.date.accessioned | 2015-10-16T20:48:24Z | |
dc.date.available | 2015-10-16T20:48:24Z | |
dc.date.issued | 2004-11-04 | |
dc.identifier | okds_Grischkowsky_PRL_2004-11-04 | |
dc.identifier.citation | Qu, D., & Grischkowsky, D. (2004). Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays. Physical Review Letters, 93(19). https://doi.org/10.1103/PhysRevLett.93.196804 | |
dc.identifier.uri | https://hdl.handle.net/11244/19916 | |
dc.description.abstract | Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. A well-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data. | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.publisher | American Physical Society | |
dc.rights | This material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information. | |
dc.title | Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays | |
osu.filename | okds_Grischkowsky_PRL_2004-11-04.pdf | |
osu.accesstype | Open Access | |
dc.description.peerreview | Peer reviewed | |
dc.identifier.doi | 10.1103/PhysRevLett.93.196804 | |
dc.description.department | Electrical and Computer Engineering | |
dc.type.genre | Article | |
dc.type.material | Text | |
dc.subject.keywords | arrays | |
dc.subject.keywords | electromagnetic files | |
dc.subject.keywords | electromagnetic wave attenuation | |
dc.subject.keywords | fourier transforms | |
dc.subject.keywords | frequency domain analysis | |
dc.subject.keywords | lithography | |
dc.subject.keywords | silicon wafers | |
dc.subject.keywords | surface plasmon resonance | |
dc.subject.keywords | thin films | |
dc.subject.keywords | time domain analysis | |
dc.subject.keywords | amplitude resonnances | |
dc.subject.keywords | fractional order surface plasmons | |
dc.subject.keywords | hole array | |
dc.subject.keywords | phase resonances | |