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dc.contributor.authorCheville, R. A.
dc.contributor.authorMcGowan, R. W.
dc.contributor.authorGrischkowsky, D.
dc.date.accessioned2015-10-16T20:48:23Z
dc.date.available2015-10-16T20:48:23Z
dc.date.issued1998-01-12
dc.identifierokds_Grischkowsky_PRL_1998-01-12
dc.identifier.citationCheville, R. A., McGowan, R. W., & Grischkowsky, D. (1998). Time resolved measurements which isolate the mechanisms responsible for terahertz glory scattering from dielectric spheres. Physical Review Letters, 80(2), 269-272. https://doi.org/10.1103/PhysRevLett.80.269
dc.identifier.urihttps://hdl.handle.net/11244/19914
dc.description.abstractThe surface-wave scattering processes responsible, in part, for the optical glory have never been compared with theoretical predictions. Here, THz impulse ranging is used to measure the time domain impulse response of spherical targets with sufficiently high temporal resolution to permit the surface-wave contribution to the total impulse response to be isolated. The first direct experimental comparison for the surface wave with Mie theory as well as the surface-wave approximation of van de Hulst is performed. Interference of the surface waves from a dielectric sphere is shown to lead to the frequency and angular intensity dependence of the THz glory.
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dc.languageen_US
dc.publisherAmerican Physical Society
dc.rightsThis material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information.
dc.titleTime resolved measurements which isolate the mechanisms responsible for terahertz glory scattering from dielectric spheres
osu.filenameokds_Grischkowsky_PRL_1998-01-12.pdf
dc.description.peerreviewPeer reviewed
dc.identifier.doi10.1103/PhysRevLett.80.269
dc.description.departmentElectrical and Computer Engineering
dc.type.genreArticle
dc.type.materialText


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