dc.contributor.author | van Exter, Martin | |
dc.contributor.author | Grischkowsky, D. | |
dc.date.accessioned | 2015-10-16T20:48:19Z | |
dc.date.available | 2015-10-16T20:48:19Z | |
dc.date.issued | 1990-06-15 | |
dc.identifier | okds_Grischkowsky_PRB_1990-06-15 | |
dc.identifier.citation | van Exter, M., & Grischkowsky, D. (1990). Carrier dynamics of electrons and holes in moderately doped silicon. Physical Review B, 41(17), 140-149. https://doi.org/10.1103/PhysRevB.41.12140 | |
dc.identifier.uri | https://hdl.handle.net/11244/19898 | |
dc.description.abstract | A time-domain spectroscopic technique, based on the generation and detection of a collimated beam of subpicosecond broadband terahertz pulses, is used to measure the absorption and dispersion of n- and p-type silicon, with resistivities of 0.1, 1, and 10 Ohm-cm in the submillimeter range of 0.1-2 THz. From the transmission measurements performed at room temperature and at 80 K, the absorption and dispersion, and concomitantly the full complex conductivity, of the doped silicon could be obtained. The results provide an accurate view on the dynamics of the electrons and the holes. Although the simple Drude model, with an energy-independent relaxation time, gives a surprisingly accurate description of the observed carrier dynamics, the measurements do show that some refinements are needed. An extended model, with an energy-dependent carrier-relaxation rate, can explain most of the observed deviations from the simple Drude model. | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.publisher | American Physical Society | |
dc.rights | This material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information. | |
dc.title | Carrier dynamics of electrons and holes in moderately doped silicon | |
osu.filename | okds_Grischkowsky_PRB_1990-06-15.pdf | |
dc.description.peerreview | Peer reviewed | |
dc.identifier.doi | 10.1103/PhysRevB.41.12140 | |
dc.description.department | Electrical and Computer Engineering | |
dc.type.genre | Article | |
dc.type.material | Text | |
dc.subject.keywords | semiconductor | |
dc.subject.keywords | absorption spectra | |
dc.subject.keywords | transmission spectra | |
dc.subject.keywords | time-domain spectroscopic technique | |
dc.subject.keywords | subpicosecond broadband terahertz pulses | |
dc.subject.keywords | complex conductivity | |
dc.subject.keywords | drude model | |
dc.subject.keywords | carrier dynamics | |
dc.subject.keywords | carrier-relaxation | |
dc.subject.keywords | 0.1 to 2 thz | |