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Reduced conductivity in the terahertz skin-depth layer of metals

dc.contributor.authorLaman, N.
dc.contributor.authorGrischkowsky, D.
dc.date.accessioned2015-10-16T20:48:15Z
dc.date.available2015-10-16T20:48:15Z
dc.date.issued2007-03-23
dc.identifierokds_Grischkowsky_APL_2007-03-23
dc.identifier.citationLaman, N., & Grischkowsky, D. (2007). Reduced conductivity in the terahertz skin-depth layer of metals. Applied Physics Letters, 90(12), Article 122115. https://doi.org/10.1063/1.2716066
dc.identifier.urihttps://hdl.handle.net/11244/19883
dc.description.abstractThe terahertz conductivities of plates of Cu and Al were measured to remain the same at 295 and 77 K using waveguide terahertz time domain spectroscopy (THz-TDS). This result was true for a variety of commercial alloys and surface preparations. Consequently, carrier scattering by lattice defects within the 100 nm THz skin depth is much larger than scattering by phonons at room temperature. However, an exception was found to be the THz skin-depth layer of an evaporated 300 nm Al film in contact with a polished Si surface. For this interface Al layer, the conductivity increased by a factor of 4 when cooled to 77 K.
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dc.languageen_US
dc.publisherAIP Publishing
dc.rightsThis material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information.
dc.titleReduced conductivity in the terahertz skin-depth layer of metals
osu.filenameokds_Grischkowsky_APL_2007-03-23.pdf
dc.description.peerreviewPeer reviewed
dc.identifier.doi10.1063/1.2716066
dc.description.departmentElectrical and Computer Engineering
dc.type.genreArticle
dc.type.materialText
dc.subject.keywordsaluminum compounds
dc.subject.keywordscopper compounds
dc.subject.keywordsphonons
dc.subject.keywordsscattering
dc.subject.keywordssurface properties
dc.subject.keywordstime domain analysis
dc.subject.keywordsreduced conductivity
dc.subject.keywordsterahertz conductivity
dc.subject.keywordsterahertz skin depth layers
dc.subject.keywordsterahertz time domain spectroscopy


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