dc.contributor.author | Reiten, M. T. | |
dc.contributor.author | Grischkowsky, D. | |
dc.contributor.author | Cheville, R. A. | |
dc.date.accessioned | 2015-10-16T20:48:11Z | |
dc.date.available | 2015-10-16T20:48:11Z | |
dc.date.issued | 2001-02-19 | |
dc.identifier | okds_Grischkowsky_APL_2001-02-19 | |
dc.identifier.citation | Reiten, M. T., Grischkowsky, D., & Cheville, R. A. (2001). Properties of surface waves determined via bistatic terahertz impulse ranging. Applied Physics Letters, 78(8), 1146-1148. https://doi.org/10.1063/1.1350418 | |
dc.identifier.uri | https://hdl.handle.net/11244/19869 | |
dc.description.abstract | A bistatic terahertz impulse ranging system has permitted the full isolation and direct measurements of the surface wave loss and dispersion for terahertz frequencies on a dielectric cylinder. This system permits ranging investigations with variable bistatic angles between the source and detector. Direct, frequency dependent comparisons of surface wave loss and propagation velocity are compared to Mie theory and previous measurements of surface wave propagation over a 1 THz bandwidth. The observed radiation from the surface waves is seen to depend on the path of the radiation in and along the scatterer. | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.publisher | AIP Publishing | |
dc.rights | This material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information. | |
dc.title | Properties of surface waves determined via bistatic terahertz impulse ranging | |
osu.filename | okds_Grischkowsky_APL_2001-02-19.pdf | |
dc.description.peerreview | Peer reviewed | |
dc.identifier.doi | 10.1063/1.1350418 | |
dc.description.department | Electrical and Computer Engineering | |
dc.type.genre | Article | |
dc.type.material | Text | |