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dc.contributor.authorGallot, G.
dc.contributor.authorZhang, Jiangquan
dc.contributor.authorMcGowan, R. W.
dc.contributor.authorJeon, Tae-In
dc.contributor.authorGrischkowsky, D.
dc.date.accessioned2015-10-16T20:48:10Z
dc.date.available2015-10-16T20:48:10Z
dc.date.issued1999-06-07
dc.identifierokds_Grischkowsky_APL_1999-06-07
dc.identifier.citationGallot, G., Zhang, J., McGowan, R. W., Jeon, T.-I., & Grischkowsky, D. (1999). Measurements of the THz absorption and dispersion of ZnTe and their relevance to the electro-optic detection of THz radiation. Applied Physics Letters, 74(23), 3450-3452. https://doi.org/10.1063/1.124124
dc.identifier.urihttps://hdl.handle.net/11244/19865
dc.description.abstractVia THz time-domain spectroscopy, we have measured the absorption and index of refraction of single-crystal (110) ZnTe from 0.3 to 4.5 THz. We find that the absorption is dominated by two lower-frequency phonon lines at 1.6 and 3.7 THz and not by the transverse-optical (TO) -phonon line at 5.3 THz as previously assumed. However, the index of refraction is determined mainly by the TO-phonon line. Using these data, we discuss a frequency-domain picture of electro-optic detection of THz radiation below the TO-phonon resonance and compare with the photoconductive THz receiver over the same frequency range.
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dc.languageen_US
dc.publisherAIP Publishing
dc.rightsThis material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information.
dc.titleMeasurements of the THz absorption and dispersion of ZnTe and their relevance to the electro-optic detection of THz radiation
osu.filenameokds_Grischkowsky_APL_1999-06-07.pdf
dc.description.peerreviewPeer reviewed
dc.identifier.doi10.1063/1.124124
dc.description.departmentElectrical and Computer Engineering
dc.type.genreArticle
dc.type.materialText


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