dc.contributor.author | Grischkowsky, D. | |
dc.contributor.author | Keiding, Soren | |
dc.contributor.author | van Exter, Martin | |
dc.contributor.author | Fattinger, Ch. | |
dc.date.accessioned | 2015-10-16T20:48:07Z | |
dc.date.available | 2015-10-16T20:48:07Z | |
dc.date.issued | 1990-10 | |
dc.identifier | okds_Grischkowsky_APL_1990-10.pdf | |
dc.identifier.citation | Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C. (1990). Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors. Journal of the Optical Society of America B, 7(10), 2006-2015. https://doi.org/10.1364/josab.7.002006 | |
dc.identifier.uri | https://hdl.handle.net/11244/19856 | |
dc.description.abstract | Using the method of time-domain spectroscopy, we measure the far-infrared absorption and dispersion from 0.2 to 2 THz of the crystalline dielectrics sapphire and quartz, fused silica, and the semiconductors silicon, gallium, arsenide, and germanium. For sapphire and quartz, the measured absorptions are consisted with the earlier work below 0.5 THz. Above 1 THz we measure significantly more absorption for sapphire, while for quartz our values are consistent with those on the most transpired fused silica measured to date. For the semiconductors, we show that many of the previous measurements on silicon were dominated by the effects of carriers due to impurities. For high-resistivity, 10-kOhm-cm silicon, we measure a remarkable transparency together with an exceptionally nondispersive index of refraction. For GaAs our measurements extend the precision of the previous work, and we resolve two weak absorption features at 0.4 and 0.7 THz. Our measurements on germanium demonstrate the dominant role of intrinsic carriers; the measured absorption and dispersion are well fitted by the simple Drude theory. | |
dc.format | application/pdf | |
dc.language | en_US | |
dc.publisher | Optical Society of America | |
dc.rights | This material has been previously published. In the Oklahoma State University Library's institutional repository this version is made available through the open access principles and the terms of agreement/consent between the author(s) and the publisher. The permission policy on the use, reproduction or distribution of the material falls under fair use for educational, scholarship, and research purposes. Contact Digital Resources and Discovery Services at lib-dls@okstate.edu or 405-744-9161 for further information. | |
dc.title | Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors | |
osu.filename | okds_Grischkowsky_APL_1990-10.pdf | |
dc.description.peerreview | Peer reviewed | |
dc.identifier.doi | 10.1364/JOSAB.7.002006 | |
dc.description.department | Electrical and Computer Engineering | |
dc.type.genre | Article | |
dc.type.material | Text | |