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Measurement and noise characterization of optically induced index changes using THz interferometry
(AIP Publishing, 2004-05-24)
A Michelson interferometer designed for broadband single-cycle THz pulses is used to characterize optically induced index changes in semiconductors which result in submicron changes in optical path length. The interferometric ...
Part-per-million gas detection from long-baseline THz spectroscopy
(AIP Publishing, 2004-09-13)
We report a long-baseline THz time domain spectrometer based on a White cell design capable of detecting gas species in the low part-per-million range in near real time. Coherent transients from methyl chloride vapor are ...