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Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors
(Optical Society of America, 1990-10)
Using the method of time-domain spectroscopy, we measure the far-infrared absorption and dispersion from 0.2 to 2 THz of the crystalline dielectrics sapphire and quartz, fused silica, and the semiconductors silicon, gallium, ...