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dc.date.accessioned2015-07-23T15:35:47Z
dc.date.available2015-07-23T15:35:47Z
dc.date.issued2006-02-21
dc.identifierpat7002163
dc.identifier.urihttps://hdl.handle.net/11244/15390
dc.description.abstractThere is provided herein a system and method for obtaining measurements of radiation exposure in real time using OSL and for obtaining improved accurate OSL measurements over a greater range of radiation exposures. In a preferred embodiment a signal-versus-dose response is obtained from an OSL dosimeter that is linear over all doses and does not exhibit saturation effects. The desired response is preferably calculated from the measured OSL-versus-time response from a suitable dosimeter obtained during irradiation. To obtain the desired response from the measured OSL data each measured OSL point has to be corrected for the depletion of the trapped electron concentration that occurs during each illumination period.
dc.formatapplication/pdf
dc.format.extent13 pages
dc.languageen_US
dc.publisherU.S. Patent and Trademark Office
dc.titleOptically Stimulated Luminescence Radiation Dosimetry Method to Determine Integrated Doses and Dose Rates and a Method to Extend the Upper Limit of Measureable Absorbed Radiation Doses During Irradiation
dc.typetext
osu.filenamepat7002163.pdf
osu.accesstypeOpen Access
dc.type.genrePatent
dc.contributor.inventorPolf, Jerimy C.
dc.contributor.inventorGaza, Razvan
dc.contributor.inventorMcKeever, Stephen W. S.
dc.identifier.patentID7,002,163
dc.date.filed2004-05-24
dc.contributor.assigneeBoard of Regents/Oklahoma State University and the A & M Colleges
dc.subject.primaryusclass250/484.5
dc.subject.otherusclasses250/484.4
dc.subject.cpcclassesG01T 1/105 (20130101)


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