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Statistical Analog Monitor
(U.S. Patent and Trademark Office, 1975-10-07)
This abstract describes an instrument for the statistical study of the various analog parameters of a physical operation, which vary with time. The parameters may be, for example, voltage, pressure, volume, etc. A selected ...
Aggregate Surface Area Measurement Method
(U.S. Patent and Trademark Office, 1975-10-28)
Method and apparatus for determining the exposed surface area of a plurality of samples of selected mineral aggregate particles which have previously been coated with asphalt and subsequently partially stripped of asphalt. ...