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dc.contributor.authorImark, Robert
dc.date.accessioned2014-11-03T16:07:54Z
dc.date.available2014-11-03T16:07:54Z
dc.date.issued1992-07-01
dc.identifier.urihttps://hdl.handle.net/11244/13488
dc.description.abstractDesigning Very Large Integrated Circuit Tester II, making a prototype, and documenting it are a challenging yet rewarding experience.
dc.formatapplication/pdf
dc.languageen_US
dc.publisherOklahoma State University
dc.rightsCopyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material.
dc.titleVery Large Scale Integrated Circuit Tester II
dc.typetext
osu.filenameThesis-1992-I31v.pdf
osu.accesstypeOpen Access
dc.description.departmentElectrical Engineering
dc.type.genreThesis


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