X-Ray Diffraction Studies of GaN and InGaN Semiconductor Heterostructures

dc.contributor.author	Fedler, Fritz
dc.date.accessioned	2014-09-29T16:11:18Z
dc.date.available	2014-09-29T16:11:18Z
dc.date.issued	1998-12-01
dc.identifier.uri	https://hdl.handle.net/11244/11979
dc.format	application/pdf
dc.language	en_US
dc.publisher	Oklahoma State University
dc.rights	Copyright is held by the author who has granted the Oklahoma State University Library the non-exclusive right to share this material in its institutional repository. Contact Digital Library Services at lib-dls@okstate.edu or 405-744-9161 for the permission policy on the use, reproduction or distribution of this material.
dc.title	X-Ray Diffraction Studies of GaN and InGaN Semiconductor Heterostructures
dc.type	text
osu.filename	Thesis-1998-F293x-1.pdf
osu.accesstype	Open Access
dc.type.genre	Thesis

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