Browsing by Subject "Anisotropic"
Now showing items 1-2 of 2
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Automation of Advanced Scanners for RF Metrology
(2020-05-08)The characterization of the constitutive properties of materials is an important step in the development of modern RF devices, especially at mm-wave frequencies or in systems that incorporate materials whose performance ... -
FULL ANISOTROPIC MODEL FOR SIMULATING THE INFRARED REFLECTION ABSORPTION SPECTRA (IRRAS) OF SELF-ASSEMBLED MONOLAYERS (SAMS) FROM ALL-ATOM MOLECULAR DYNAMICS SIMULATIONS
(2020-05-29)It is important to understand the internal molecular structure of molecular monolayers because that determines the physical and chemical properties of their surface. Infrared spectroscopy is a powerful method to measure ...