Browsing by Author "Doany, F. E."
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Measurement of ultrafast hot-carrier relaxation in silicon by thin-film-enhanced, time-resolved reflectivity
Doany, F. E.; Grischkowsky, D. (AIP Publishing, 1988-01-04)Time-resolved reflectivity measurements within ~100 fs resolution have revealed an initial 350 fs relaxation time in silicon, believed to be the time it takes hot, photoinjected carriers to relax to the band edge. The ...