Statistics for DEVELOP DRAFT CHIP SEAL COVER AGGREGATE SPECIFICATION BASED ON AGGREGATE IMAGING SYSTEM (AIMS) ANGULARITY, SHAPE, AND TEXTURE TEST RESULTS

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DEVELOP DRAFT CHIP SEAL COVER AGGREGATE SPECIFICATION BASED ON AGGREGATE IMAGING SYSTEM (AIMS) ANGULARITY, SHAPE, AND TEXTURE TEST RESULTS 179

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FHWA-OK-14-01 2239 Zaman.pdf 71

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